Journal of Electron Microscopy

Reviews[mdash ]Seto Award 1994:

Yoshio Bando

Microstructure Analysis of Advanced Ceramics by High-Resolution Analytical Transmission Electron Microscopy
J Electron Microsc (Tokyo) 1995 44: 115-123. [Abstract] [PDF] [Request Permissions]  

Shohei Yamashina

Dynamic Structure and Function of Golgi Apparatus in the Salivary Acinar Cells
J Electron Microsc (Tokyo) 1995 44: 124-134. [Abstract] [PDF] [Request Permissions]  

Full-length Paper:

Fumie Suzuki-Toyota, Mamiko Maekawa, Alice Cheng, and Jeffrey D. Bleil

Immuno-Colloidal Gold Labeled Surface Replica, and Its Application to Detect sp56, the Egg Recognition and Binding Protein, on the Mouse Spermatozoon
J Electron Microsc (Tokyo) 1995 44: 135-139. [Abstract] [PDF] [Request Permissions]  

Letters:

Ikuo K. Takeuchi, Eiko Aoki, and Yoshiko K. Takeuchi

Concentric Lamellar Bodies in Axon Terminals and Preterminal Axons of Cerebellar Purkinje Cells in Groggy Mutant Rat: Acid Phosphatase Cytochemistry
J Electron Microsc (Tokyo) 1995 44: 140-144. [Abstract] [PDF] [Request Permissions]  

Takayasu Hirosawa, Tomoko Saito, Tetsuo Tanaka, and Hisashi Matsushima

SEM Observation and HPLC Analysis of the Accumulation of Alpha- and Beta-acids in the Fresh Developing Hop (Humulus lupulus L.) Peltate Glandular Trichomes
J Electron Microsc (Tokyo) 1995 44: 145-147. [Abstract] [PDF] [Request Permissions]  

Eichi Yamada

Intimate Association of H⁺-ATPase Vesicles with Mitochondria in the Intercalated Cell of the Renal Collecting Duct
J Electron Microsc (Tokyo) 1995 44: 148-150. [Abstract] [PDF] [Request Permissions]  

Notes:

Yoshiko Itoh, Hiroshi Haji, Hideharu Nakashima, and Haruo Kishida

Ultramicrotomy of Wire-bonded Interfaces for TEM Observation
J Electron Microsc (Tokyo) 1995 44: 151-153. [Abstract] [PDF] [Request Permissions]  

Kazuo Ishizuka

Coma-free Alignment Using Diffractograms of TV Images
J Electron Microsc (Tokyo) 1995 44: 154-158. [Abstract] [PDF] [Request Permissions]  

Hisayuki Suematsu, Yoshio Bando, and Mamoru Mitomo

Plasma Etching of TEM Samples for Observing Grain Boundaries in Silicon Nitride
J Electron Microsc (Tokyo) 1995 44: 159-164. [Abstract] [PDF] [Request Permissions]  

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