Journal of Electron Microscopy

Full-length Papers:

Carlo Dell' Orbo, Luciana Gioglio, and Daniela Quacci

The Paracoronal (Marginal) Cells of Fungiform Papilla of Rana esculenta
J Electron Microsc (Tokyo) 1995 44: 165-173. [Abstract] [PDF] [Request Permissions]  

Hiroyasu Shibahara, Kazuhiko Numaguchi, Masahiro Kawasaki, Hiromi Takizawa, Tetsuo Oikawa, and Hideki Taguchi

Quantification of Oxygen Vacancies in Perovskite using a 300 kV HREM with an Imaging Plate
J Electron Microsc (Tokyo) 1995 44: 174-181. [Abstract] [PDF] [Request Permissions]  

Bo Bian, Tadakatsu Ohkubo, and Yoshihiko Hirotsu

Crystallization and Fractal Formation in Annealed a-Ge/Au Bilayer Films
J Electron Microsc (Tokyo) 1995 44: 182-190. [Abstract] [PDF] [Request Permissions]  

Soichiro Arai, Masanobu Hayashi, and Yuh H. Nakanishi

Salt-Dependent Structural Changes of Chromatin in Isolated Chicken Liver Nuclei as Visualized by Scanning Electron Microscopy
J Electron Microsc (Tokyo) 1995 44: 191-17. [Abstract] [PDF] [Request Permissions]  

Masako Osumi, Naoko Yamada, Hiroko Yaguchi, Hiromi Kobori, Takashi Nagatani, and Mitsugu Sato

Ultrahigh-resolution Low-voltage SEM Reveals Ultrastructure of the Glucan Network Formation from Fission Yeast Protoplast
J Electron Microsc (Tokyo) 1995 44: 198-206. [Abstract] [PDF] [Request Permissions]  

Mineo Kure, Keijirou Araki, and Takuro Ogata

Scanning Tunneling Microscopic Study of Osmium-Impregnated Collagen
J Electron Microsc (Tokyo) 1995 44: 207-211. [Abstract] [PDF] [Request Permissions]  

Susumu Yamada and Michiyoshi Tanaka

Determination of the Displacement Vector at a Stacking Fault in TiO₂ by Convergent-Beam Electron Diffraction
J Electron Microsc (Tokyo) 1995 44: 212-218. [Abstract] [PDF] [Request Permissions]  

Nobuko Katagiri, Yasuo Katagiri, Yuichi Shimatani, and Yoko Hashimoto

Cell Type and Fine Structure of the Retina of Onchidium Stalk-eye
J Electron Microsc (Tokyo) 1995 44: 219-230. [Abstract] [PDF] [Request Permissions]  

Abstracts:

The Fifty-first Annual Meeting of the Japanese Society of Electron Microscopy
J Electron Microsc (Tokyo) 1995 44: 231-265. [PDF] [Request Permissions]  

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