Journal of Electron Microscopy

Preface:

Yoshio Bando, Hisamitsu Endoh, John R. Guenter, and Makoto Shiojiri

Preface to HAFN special issue
J Electron Microsc (Tokyo) 1999 48: 671. [PDF] [Request Permissions]  

Reviews:

A. Howie, J. Aizpurua, F. J. Garcia de Abajo, and B. K. Rafferty

Localized valence spectroscopy of complex nanostructures
J Electron Microsc (Tokyo) 1999 48: 673-679. [Abstract] [PDF] [Request Permissions]  

Izabela M. Sosnowska and Makoto Shiojiri

Oxides: neutron and synchrotron X-ray diffraction studies
J Electron Microsc (Tokyo) 1999 48: 681-687. [Abstract] [PDF] [Request Permissions]  

Full-length papers:

Haruyuki Inui, Takashi Hashimoto, Kazuhiro Ito, Masaharu Yamaguchi, and Masahiro Kawasaki

Structure and chemistry of planar defects in bulk and thin film MoSi₂
J Electron Microsc (Tokyo) 1999 48: 689-700. [Abstract] [PDF] [Request Permissions]  

Dmitri Golberg, Yoshio Bando, Odile Stéphan, Laure Bourgeois, Keiji Kurashima, Takayoshi Sasaki, Tadao Sato, and Chris Goringe

New fullerenes in the B-C-N system: synthesis and analysis by an electron beam
J Electron Microsc (Tokyo) 1999 48: 701-709. [Abstract] [PDF] [Request Permissions]  

Raymond F. Egerton

Spatial resolution of nanostructural analysis by electron energy-loss spectroscopy and energy-filtered imaging
J Electron Microsc (Tokyo) 1999 48: 711-716. [Abstract] [PDF] [Request Permissions]  

M. Foeth, A. Sfera, P. Stadelmann, and P.-A. Buffat

A comparison of HREM and weak beam transmission electron microscopy for the quantitative measurement of the thickness of ferroelectric domain walls
J Electron Microsc (Tokyo) 1999 48: 717-723. [Abstract] [PDF] [Request Permissions]  

Aleksandra Czyrska-Filemonowicz, Krzysztof Szot, Anna Wasilkowska, Akilash Kumar Tyagi, and Willem J. Quadakkers

Oxide scale formation and microstructural changes during high temperature exposure of mechanically alloyed ODS alloys studied by AFM, TEM and SIMS/SNMS
J Electron Microsc (Tokyo) 1999 48: 725-730. [Abstract] [PDF] [Request Permissions]  

Shugo Hashimoto, Tetsuya Ogawa, Seiji Isoda, and Takashi Kobayashi

Electron diffraction analysis of polymorph structures in ultra thin film of vanadyl phthalocyanine on KBr (001)
J Electron Microsc (Tokyo) 1999 48: 731-738. [Abstract] [PDF] [Request Permissions]  

Kaname Yoshida, Seiji Isoda, Masahiko Tsujimoto, Toyonari Yaji, Takashi Nemoto, and Takashi Kobayashi

Combined microscopic analyses of organic hetero-interface
J Electron Microsc (Tokyo) 1999 48: 739-745. [Abstract] [PDF] [Request Permissions]  

Jack M. Blakely, So Tanaka, and Ruud M. Tromp

Atomic step dynamics on periodic semiconductor surface structures
J Electron Microsc (Tokyo) 1999 48: 747-752. [Abstract] [PDF] [Request Permissions]  

B. Bian, Y. Hirotsu, K. Sato, T. Ohkubo, and A. Makino

Structures and magnetic properties of oriented Fe/Au and Fe/Pt nanoparticles on a-Al₂O₃
J Electron Microsc (Tokyo) 1999 48: 753-759. [Abstract] [PDF] [Request Permissions]  

Jun-Ichiro Furihata and Toshio Okabe

Crystalline approximants of decagonal quasicrystals in the Al-Cu-Cr system
J Electron Microsc (Tokyo) 1999 48: 761-766. [Abstract] [PDF] [Request Permissions]  

Shunsuke Muto, Shigeo Horiuchi, and Tetsuo Tanabe

Local structural order in electron-irradiated graphite studied by high-resolution high-voltage electron microscopy
J Electron Microsc (Tokyo) 1999 48: 767-776. [Abstract] [PDF] [Request Permissions]  

Masanori Hosomi and Amanda K. Petford-Long

TEM observation of the microstructure in sputtered NiFe/Au multilayer films
J Electron Microsc (Tokyo) 1999 48: 777-784. [Abstract] [PDF] [Request Permissions]  

X. L. Ma, K. Yamagiwa, J. Shibata, T. Hirayama, I. Hirabayashi, and Y. Ikuhara

Characterization of the YbBa₂Cu₃O_7–y and YBa₂Cu₃O_7–y thin superconducting films prepared by chemical solution deposition on MgO(001) substrate
J Electron Microsc (Tokyo) 1999 48: 785-789. [Abstract] [PDF] [Request Permissions]  

Note:

Yasufumi Yabuuchi and Sachiko Inazato

Failure analysis of laser diodes by SEM and TEM
J Electron Microsc (Tokyo) 1999 48: 791-794. [Abstract] [PDF] [Request Permissions]  

Hidetoshi Utsuro, Yoshizo Takai, Takashi Ikuta, and Ryuichi Shimizu

Optimization of voltage axis alignment in high-resolution electron microscopy
J Electron Microsc (Tokyo) 1999 48: 905-907. [Abstract] [PDF] [Request Permissions]  

Letters:

Anna Carlsson, Mizue Kaneda, Yasuhiro Sakamoto, Osamu Terasaki, Ryong Ryoo, and Sang Hoon Joo

The structure of MCM–48 determined by electron crystallography
J Electron Microsc (Tokyo) 1999 48: 795-798. [Abstract] [PDF] [Request Permissions]  

H. Ichinose, H. Sawada, E. Takuma, and M. Osaki

Atomic resolution HVEM and environmental noise
J Electron Microsc (Tokyo) 1999 48: 887-891. [Abstract] [PDF] [Request Permissions]  

Tamaki Shibayama, Heishichiro Takahashi, M. Kawasaki, and Akira Kohyama

Interface structure analysis of SiC fibres reinforced SiC matrix composites by energy filtering TEM
J Electron Microsc (Tokyo) 1999 48: 893-897. [Abstract] [PDF] [Request Permissions]  

Shigemasa Ohta and Heishichiro Takahashi

Nanoscale analysis of electron irradiation-enhanced diffusion process on the multilayer interfaces of W-Al₂O₃-Ti/Cu
J Electron Microsc (Tokyo) 1999 48: 899-903. [Abstract] [PDF] [Request Permissions]  

Seto Award:

K Tsuno

Optical design of electron microscope lenses and energy filters
J Electron Microsc (Tokyo) 1999 48: 801-820. [Abstract] [PDF] [Request Permissions]  

Physical: Full-length Papers:

Knut Urban, Bernd Kabius, Max Haider, and Harald Rose

A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope
J Electron Microsc (Tokyo) 1999 48: 821-826. [Abstract] [PDF] [Request Permissions]  

Fu-Rong Chen, J. J. Kai, L. Chang, J. Y. Wang, and W. J. Chen

Improvement of resolution by maximum entropy linear image restoration for NiSi₂/Si interface
J Electron Microsc (Tokyo) 1999 48: 827-836. [Abstract] [PDF] [Request Permissions]  

Yasumasa Tanishiro, Kimiharu Okamoto, Masaki Takeguchi, Hiroki Minoda, Takayuki Suzuki, and Katsumichi Yagi

Design features of a new ultra-high vacuum electron microscope with an omega filter
J Electron Microsc (Tokyo) 1999 48: 837-842. [Abstract] [PDF] [Request Permissions]  

H. Lemmens, O. Richard, G. Van Tendeloo, and U. Bismayer

Microstructure and phase transitions in Pb(Sc_0.5Ta_0.5)O₃
J Electron Microsc (Tokyo) 1999 48: 843-847. [Abstract] [PDF] [Request Permissions]  

C. J. Rossouw and P. R. Miller

Analysis of incoherent channelling patterns formed by X-ray emission from host lattice species and interstitial Cr in mullite
J Electron Microsc (Tokyo) 1999 48: 849-864. [Abstract] [PDF] [Request Permissions]  

Kiyokazu Yoshida, Akio Takaoka, Soichiro Hayashi, and Isao Matsui

Development of a remote operation system for an ultra-high-voltage electron microscope
J Electron Microsc (Tokyo) 1999 48: 865-872. [Abstract] [PDF] [Request Permissions]  

Yoshihide Kimura, Yoshizo Takai, Tasahiro Kawasaki, Ryuichi Shimizu, Takashi Ikuta, Shigeto Isakozawa, Yuji Satou, and Mikio Ichihashi

Development of a real-time defocus image modulation processing electron microscope. I. Construction
J Electron Microsc (Tokyo) 1999 48: 873-878. [Abstract] [PDF] [Request Permissions]  

Yoshizo Takai, Yoshihide Kimura, Takashi Ikuta, Ryuichi Shimizu, Yuji Sato, Shigehito Isakozawa, and Mikio Ichihashi

Development of a real-time defocus-image modulation processing electron microscope. II. Dynamic observation of spherical aberration-free phase image of surface atoms
J Electron Microsc (Tokyo) 1999 48: 879-885. [Abstract] [PDF] [Request Permissions]  

Biological full-length papers:

Megumi Iwano, Masao Wada, Yohji Morita, Hiroshi Shiba, Seiji Takayama, and Akira Isogai

X-ray microanalysis of papillar cells and pollen grains in the pollination process in Brassica using a variable-pressure scanning electron microscope
J Electron Microsc (Tokyo) 1999 48: 909-917. [Abstract] [PDF] [Request Permissions]  

Takashi Sawada and Sadayuki Inoue

Ultrastructural verification of anchoring role of lamina fibroreticularis of dental basement membrane in odontogenesis
J Electron Microsc (Tokyo) 1999 48: 919-928. [Abstract] [PDF] [Request Permissions]  

Naotaka Watanabe, Yozo Miyake, Takashi Wakabayashi, and Jiro Usukura

Periciliary structure of developing rat photoreceptor cells. A deep etch replica and freeze substitution study
J Electron Microsc (Tokyo) 1999 48: 929-935. [Abstract] [PDF] [Request Permissions]  

Yoshio Hiramatsu, Fumio Uno, Mariko Yoshida, Yoshihiro Hatano, and Shiro Nii

Poxvirus virions: their surface ultrastructure and interaction with the surface membrane of host cells
J Electron Microsc (Tokyo) 1999 48: 937-946. [Abstract] [PDF] [Request Permissions]  

Hiroyuki Yano and Seiichi Sato

Alterations of the intranucleolar DNA localization caused by hypoxic conditions in excised root tips of Allium cepa
J Electron Microsc (Tokyo) 1999 48: 947-955. [Abstract] [PDF] [Request Permissions]  

Victor I. Popov, Dimitry A. Ignat'ev, and Bernd Lindemann

Ultrastructure of taste receptor cells in active and hibernating ground squirrels
J Electron Microsc (Tokyo) 1999 48: 957-969. [Abstract] [PDF] [Request Permissions]  

Erratum:

Teruhisa Hirai, Kazuyoshi Murata, Kaoru Mitsuoka, Yoshiaki Kimura, and Yoshinori Fujiyoshi

Trehalose embedding technique for high-resolution electron crystallography: application to structural study on bacteriorhodopsin
J Electron Microsc (Tokyo) 1999 48: 971. [Abstract] [PDF] [Request Permissions]  

Author index:

Author index
J Electron Microsc (Tokyo) 1999 48: 973-975. [PDF] [Request Permissions]  

Subject index:

Subject index
J Electron Microsc (Tokyo) 1999 48: 977-980. [PDF] [Request Permissions]  

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