Journal of Electron Microscopy

Preface:

Seiji Takeda and David Cherns

Preface to Recent Developments in the Electron Microscopy of Semiconductors
J Electron Microsc (Tokyo) 2000 49: 209. [PDF] [Request Permissions]  

Articles:

Y. Naitoh, K. Takayanagi, Y. Oshima, and H. Hirayama

Simultaneous STM and UHV electron microscope observation of silicon nanowires extracted from Si(111) surface
J Electron Microsc (Tokyo) 2000 49: 211-216. [Abstract] [PDF] [Request Permissions]  

Full-length papers:

Motoshi Shibata, Alexander A. Shklyaev, and Masakazu Ichikawa

Observation and nucleation control of Genanoislands on Si(111) surfaces using scanning reflection electron microscopy
J Electron Microsc (Tokyo) 2000 49: 217-223. [Abstract] [PDF] [Request Permissions]  

Yoshikazu Homma, Paul Finnie, and Toshio Ogino

Control of island formation on silicon surfaces using ultra–high–vacuum scanning electron microscopy
J Electron Microsc (Tokyo) 2000 49: 225-229. [Abstract] [PDF] [Request Permissions]  

Yan Xin, Edward M. James, Nigel D. Browning, and Steve J. Pennycook

Atomic resolution Z–contrast imaging of semiconductors
J Electron Microsc (Tokyo) 2000 49: 231-244. [Abstract] [PDF] [Request Permissions]  

Karsten Tillmann and Wolfgang Jäger

Quantitative HRTEM analysis of semiconductor quantum dots
J Electron Microsc (Tokyo) 2000 49: 245-257. [Abstract] [PDF] [Request Permissions]  

P. M. Voyles, J. M. Gibson, and M. M. J. Treacy

Fluctuation microscopy: a probe of atomic correlations in disordered materials
J Electron Microsc (Tokyo) 2000 49: 259-266. [Abstract] [PDF] [Request Permissions]  

Philip E. Batson

Near–edge conduction band electronic states in SiGe alloys
J Electron Microsc (Tokyo) 2000 49: 267-273. [Abstract] [PDF] [Request Permissions]  

Hideo Kohno, Seiji Takeda, and Koji Tanaka

Plasmon–loss imaging of chains of crystalline–silicon nanospheres and silicon nanowires
J Electron Microsc (Tokyo) 2000 49: 275-280. [Abstract] [PDF] [Request Permissions]  

J. S. Barnard and D. Cherns

Direct observation of piezoelectric fields in GaN/InGaN/GaN strained quantum wells
J Electron Microsc (Tokyo) 2000 49: 281-291. [Abstract] [PDF] [Request Permissions]  

D. J. Eaglesham, V. C. Venezia, H.-J. Gossmann, and A. Agarwal

Quantitative TEM of point defects in Si
J Electron Microsc (Tokyo) 2000 49: 293-298. [Abstract] [PDF] [Request Permissions]  

Angus J. Wilkinson

Advances in SEM–based diffraction studies of defects and strains in semiconductors
J Electron Microsc (Tokyo) 2000 49: 299-310. [Abstract] [PDF] [Request Permissions]  

Cordelia P. Sealy, Martin R. Castell, and Peter R. Wilshaw

Mechanism for secondary electron dopant contrast in the SEM
J Electron Microsc (Tokyo) 2000 49: 311-321. [Abstract] [PDF] [Request Permissions]  

Akira Sakai, Haruo Sunakawa, Akitaka Kimura, and Akira Usui

Dislocation propagation in GaN films formed by epitaxial lateral overgrowth
J Electron Microsc (Tokyo) 2000 49: 323-330. [Abstract] [PDF] [Request Permissions]  

Noriyuki Kuwano, Keisuke Tsukamoto, Wataru Talki, Kayo Horibuchi, Kensuke Oki, Yasutoshi Kawaguchi, Takumi Shibata, Nobuhiko Sawaki, and Kazumasa Hiramatsu

Gradual tilting of crystallographic orientation and configuration of dislocations in GaN selectively grown by vapour phase epitaxy methods
J Electron Microsc (Tokyo) 2000 49: 331-338. [Abstract] [PDF] [Request Permissions]  

Zuzanna Liliental-Weber

Derivation of growth mechanism of nano–defects in GaN from TEM data
J Electron Microsc (Tokyo) 2000 49: 339-348. [Abstract] [PDF] [Request Permissions]  

Hirofumi Matsuhata, Xue-Lun Wang, and Mutsuo Ogura

Studies on the structure of crescent-shaped GaAs quantum wires by combination of electron microscopy and photoluminescence spectroscopy
J Electron Microsc (Tokyo) 2000 49: 349-355. [Abstract] [PDF] [Request Permissions]  

Hidenori Suzuki, Sanae Yokimizo, Shinobu Wakamoto, Kaori Watanabe, Kumiko Hirose, Noriko Akamatsu, and Kenjiro Tanoue

Transloation of sle^xon the azurophilic granule membrane to the plasma membrane in activated human neutrophils
J Electron Microsc (Tokyo) 2000 49: 359-370. [Abstract] [PDF] [Request Permissions]  

Biological full-length papers:

Eiki Adachi and Keiko Matsubara

Reproducibility and applicability of gallium replication as evaluated by biological specimen use
J Electron Microsc (Tokyo) 2000 49: 371-378. [Abstract] [PDF] [Request Permissions]  

M. M. Bird and A. Owen

The effect of calcium ionophore A23187 on neurites from embryonic mouse spinal cord explants in culture
J Electron Microsc (Tokyo) 2000 49: 379-386. [Abstract] [PDF] [Request Permissions]  

Eisuke Nara, Tokuji Osawa, Jung-Chou Liang, Yaoguang Wang, and Yohichiro Nozaka

Enzyme–histochemical demonstration of lymphatic vessels in the golden hamster periodontium: an attempt to reactivate the 5'–nucleotidase activity with Mg⁺⁺ ion supply
J Electron Microsc (Tokyo) 2000 49: 387-391. [Abstract] [PDF] [Request Permissions]  

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