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contents: volume 50 • 2001 • number 2   [Index by Author] 
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To see an article, click its [Full Text] or [PDF] link. To review many abstracts, check the boxes to the left of the titles you want, and click the 'Get All Checked Abstract(s)' button. To see one abstract at a time, click its [Abstract] link.

Articles:Back

S Terada, T Aoyama, F Yano, and Y Mitsui

J Electron Microsc (Tokyo) 2001 50: 83-87; doi:10.1093/jmicro/50.2.83 [Abstract] [PDF] [Request Permissions]  

K Nakata, O Okada, and Y Ueki

J Electron Microsc (Tokyo) 2001 50: 89-96; doi:10.1093/jmicro/50.2.89 [Abstract] [PDF] [Request Permissions]  

A Adessi and M Devel

J Electron Microsc (Tokyo) 2001 50: 97-100; doi:10.1093/jmicro/50.2.97 [Abstract] [PDF] [Request Permissions]  

M Terauchi, H Yamamoto, and M Tanaka

J Electron Microsc (Tokyo) 2001 50: 101-104; doi:10.1093/jmicro/50.2.101 [Abstract] [PDF] [Request Permissions]  

J Konno, M Kawasaki, and K Hiraga

J Electron Microsc (Tokyo) 2001 50: 105-111; doi:10.1093/jmicro/50.2.105 [Abstract] [PDF] [Request Permissions]  

Y Hatano, M Yoshida, F Uno, S Yoshida, N Osafune, K Ono, and M Yamada

J Electron Microsc (Tokyo) 2001 50: 113-124; doi:10.1093/jmicro/50.2.113 [Abstract] [PDF] [Request Permissions]  

T Ikebe, T Shimada, K Ina, H Kitamura, and K Nakatsuka

J Electron Microsc (Tokyo) 2001 50: 125-132; doi:10.1093/jmicro/50.2.125 [Abstract] [PDF] [Request Permissions]  

B Coulary, M Aigle, and J Schaeffer

J Electron Microsc (Tokyo) 2001 50: 133-137; doi:10.1093/jmicro/50.2.133 [Abstract] [PDF] [Request Permissions]  

To see an article, click its [Full Text] or [PDF] link. To review many abstracts, check the boxes to the left of the titles you want, and click the 'Get All Checked Abstract(s)' button. To see one abstract at a time, click its [Abstract] link.