Journal of Electron Microscopy

Articles:

SJ Pennycook and N Tanaka

Foreword
J Electron Microsc (Tokyo) 2001 50: 139; doi:10.1093/jmicro/50.3.139 [Abstract] [PDF] [Request Permissions]  

H Kurata, H Kumagai, and K Ozasa

High-resolution elemental mapping of titanium oxide/aluminum oxide multilayer by spectrum-imaging
J Electron Microsc (Tokyo) 2001 50: 141-146; doi:10.1093/jmicro/50.3.141 [Abstract] [PDF] [Request Permissions]  

M Cowley

STEM imaging with a thin annular detector
J Electron Microsc (Tokyo) 2001 50: 147-155; doi:10.1093/jmicro/50.3.147 [Abstract] [PDF] [Request Permissions]  

K Mitsuishi, M Takeguchi, H Yasuda, and K Furuya

New scheme of calculation of annular dark-field STEM image including both elastically diffracted and TDS waves
J Electron Microsc (Tokyo) 2001 50: 157-162; doi:10.1093/jmicro/50.3.157 [Abstract] [PDF] [Request Permissions]  

N Baba, K Terayama, T Yoshimizu, N Ichise, and N Tanaka

An auto-tuning method for focusing and astigmatism correction in HAADF-STEM, based on the image contrast transfer function
J Electron Microsc (Tokyo) 2001 50: 163-176; doi:10.1093/jmicro/50.3.163 [Abstract] [PDF] [Request Permissions]  

N Dellby, L Krivanek, D Nellist, E Batson, and R Lupini

Progress in aberration-corrected scanning transmission electron microscopy
J Electron Microsc (Tokyo) 2001 50: 177-185; doi:10.1093/jmicro/50.3.177 [Abstract] [PDF] [Request Permissions]  

E Abe, H Takakura, and AP Tsai

Ho arrangement in the Zn₆Mg₃Ho icosahedral quasicrystal studied by atomic-resolution Z-contrast STEM
J Electron Microsc (Tokyo) 2001 50: 187-195; doi:10.1093/jmicro/50.3.187 [Abstract] [PDF] [Request Permissions]  

K Saitoh, M Tanaka, and P Tsai

Structural study of an Al₇₃Ni₂₂Fe₅ decagonal quasicrystal by high-angle annular dark-field scanning transmission electron microscopy
J Electron Microsc (Tokyo) 2001 50: 197-203; doi:10.1093/jmicro/50.3.197 [Abstract] [PDF] [Request Permissions]  

D Browning, I Arslan, Y Ito, M James, F Klie, P Moeck, T Topuria, and Y Xin

Application of atomic scale STEM techniquesto the study of interfaces and defects in materials
J Electron Microsc (Tokyo) 2001 50: 205-218; doi:10.1093/jmicro/50.3.205 [Abstract] [PDF] [Request Permissions]  

A Muller and J Grazul

Optimizing the environment for sub-0.2 nm scanning transmission electron microscopy
J Electron Microsc (Tokyo) 2001 50: 219-226; doi:10.1093/jmicro/50.3.219 [Abstract] [PDF] [Request Permissions]  

B Rafferty, D Nellist, and J Pennycook

On the origin of transverse incoherence in Z-contrast STEM
J Electron Microsc (Tokyo) 2001 50: 227-233; doi:10.1093/jmicro/50.3.227 [Abstract] [PDF] [Request Permissions]  

M Koguchi, H Kakibayashi, R Tsuneta, M Yamaoka, T Niino, N Tanaka, K Kase, and M Iwaki

Three-dimensional STEM for observing nanostructures
J Electron Microsc (Tokyo) 2001 50: 235-241; doi:10.1093/jmicro/50.3.235 [Abstract] [PDF] [Request Permissions]  

M Mitome, Y Bando, K Kurashima, and Y Kitami

Temperature dependency of radiation damage in inorganic materials by 300 keV electrons
J Electron Microsc (Tokyo) 2001 50: 245-249; doi:10.1093/jmicro/50.3.245 [Abstract] [PDF] [Request Permissions]  

U Kaiser

Nanocrystal formation in hexagonal SiC after Ge⁺ ion implantation
J Electron Microsc (Tokyo) 2001 50: 251-263; doi:10.1093/jmicro/50.3.251 [Abstract] [PDF] [Request Permissions]  

F-F F-Xu, Y Bando, M Zhang, C-M C-Wang, and M Mitomo

Structural imperfection of ß-Si₃N₄ crystals associated with nucleation
J Electron Microsc (Tokyo) 2001 50: 265-269; doi:10.1093/jmicro/50.3.265 [Abstract] [PDF] [Request Permissions]  

K Nishikata, T Kawasaki, Y Kimura, Y Takai, and R Shimizu

Real-time observation of spherical aberration-free phase image using high-speed image processing CCD video camera
J Electron Microsc (Tokyo) 2001 50: 271-273; doi:10.1093/jmicro/50.3.271 [Abstract] [PDF] [Request Permissions]  

A Salem and H Ishikawa

Early morphological changes in the rat soleus muscle induced by tenotomy and denervation
J Electron Microsc (Tokyo) 2001 50: 275-282; doi:10.1093/jmicro/50.3.275 [Abstract] [PDF] [Request Permissions]  

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