Journal of Electron Microscopy

Papers:

Fang Zhou

The principle of a double crystal electron interferometer
J Electron Microsc (Tokyo) 2001 50: 371-376; doi:10.1093/jmicro/50.5.371 [Abstract] [PDF] [Request Permissions]  

Koji Kimoto and Yoshio Matsui

Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique
J Electron Microsc (Tokyo) 2001 50: 377-382; doi:10.1093/jmicro/50.5.377 [Abstract] [PDF] [Request Permissions]  

Christoph Weißbäcker and Harald Rose

Electrostatic correction of the chromatic and of the spherical aberration of charged-particle lenses
J Electron Microsc (Tokyo) 2001 50: 383-390; doi:10.1093/jmicro/50.5.383 [Abstract] [PDF] [Request Permissions]  

C.J. Rossouw and K. Venkatesan

HOLZ line analysis of lattice parameters in magnesium alloys
J Electron Microsc (Tokyo) 2001 50: 391-404; doi:10.1093/jmicro/50.5.391 [Abstract] [PDF] [Request Permissions]  

Tadahiro Kawasaki, Yoshizo Takai, Takashi Ikuta, and Ryuichi Shimizu

Nano-area electron diffraction pattern reconstructed from three-dimensional Fourier spectrum
J Electron Microsc (Tokyo) 2001 50: 405-412; doi:10.1093/jmicro/50.5.405 [Abstract] [PDF] [Request Permissions]  

Nadezda Matsko, Dmitry Klinov, Anatoliy Manykin, Viktor Demin, and Sergey Klimenko

Atomic force microscopy analysis of bacteriophages KZ and T4
J Electron Microsc (Tokyo) 2001 50: 417-422; doi:10.1093/jmicro/50.5.417 [Abstract] [PDF] [Request Permissions]  

Notes:

Tadahiro Kawasaki, Yoshihide Kimura, Yoshizo Takai, and Ryuichi Shimizu

Fourier analysis of HRTEM image deterioration caused by mechanical vibration
J Electron Microsc (Tokyo) 2001 50: 413-416; doi:10.1093/jmicro/50.5.413 [Abstract] [PDF] [Request Permissions]  

Letters:

Arturo González-Robles, Adriana Flores-Langarica, Maritza Omaña-Molina, and Mineko Shibayama

Acanthamoeba castellanii: ultrastructure of trophozoites using fast freeze-fixation followed by freeze-substitution
J Electron Microsc (Tokyo) 2001 50: 423-427; doi:10.1093/jmicro/50.5.423 [Abstract] [PDF] [Request Permissions]  

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