Journal of Electron Microscopy

Preface
J Electron Microsc (Tokyo) 2002 51: S1; doi:10.1093/jmicro/51.Supplement.S1 [PDF]  

Akira Tonomura

Lorentz microscopy of vortices in superconductors
J Electron Microsc (Tokyo) 2002 51: S3-S11; doi:10.1093/jmicro/51.Supplement.S3 [Abstract] [PDF]  

Marija Gajdardziska-Josifovska, Richard Plass, Marvin A. Schofield, Daniel R. Giese, and Renu Sharma

In situ and ex situ electron microscopy studies of polar oxide surfaces with rock-salt structure
J Electron Microsc (Tokyo) 2002 51: S13-S25; doi:10.1093/jmicro/51.Supplement.S13 [Abstract] [PDF]  

Vladimir P. Oleshko, Peter A. Crozier, Rick D. Cantrell, and Alistair D. Westwood

In situ real-time environmental TEM of gas phase Ziegler–Natta catalytic polymerization of propylene
J Electron Microsc (Tokyo) 2002 51: S27-S39; doi:10.1093/jmicro/51.Supplement.S27 [Abstract] [PDF]  

Kazutaka Mitsuishi, Minghui Song, Masaki Takeguchi, Masahiro Tosa, Hidehiro Yasuda, and Kazuo Furuya

HRTEM observation of BN films segregated on stainless steel SUS304 by low temperature heat treatment
J Electron Microsc (Tokyo) 2002 51: S41-S44; doi:10.1093/jmicro/51.Supplement.S41 [Abstract] [PDF]  

Miyoko Tanaka, Masaki Takeguchi, Hidehiro Yasuda, and Kazuo Furuya

Structural observation of Pd silicide islands on Si (111) surfaces with UHV-TEM/STM
J Electron Microsc (Tokyo) 2002 51: S45-S49; doi:10.1093/jmicro/51.Supplement.S45 [Abstract] [PDF]  

Bernd Kabius, Max Haider, Stefan Uhlemann, Eugen Schwan, Knut Urban, and Harald Rose

First application of a spherical-aberration corrected transmission electron microscope in materials science
J Electron Microsc (Tokyo) 2002 51: S51-S58; doi:10.1093/jmicro/51.Supplement.S51 [Abstract] [PDF]  

Robert F. Klie and Nigel D. Browning

Characterization of oxygen ordering in (La, Sr)FeO_{3 –} by atomic resolution Z-contrast imaging and electron energy-loss spectroscopy
J Electron Microsc (Tokyo) 2002 51: S59-S66; doi:10.1093/jmicro/51.Supplement.S59 [Abstract] [PDF]  

J. M. Zuo

Quantitative electron incoherent scattering and application to nanometre-sized charge ordering in La_2/3Ca_1/3MnO₃
J Electron Microsc (Tokyo) 2002 51: S67-S72; doi:10.1093/jmicro/51.Supplement.S67 [Abstract] [PDF]  

Marco Beleggia and Giulio Pozzi

Phase-shift and phase-contrast images of pancake superconducting vortices
J Electron Microsc (Tokyo) 2002 51: S73-S77; doi:10.1093/jmicro/51.Supplement.S73 [Abstract] [PDF]  

Zhong Lin Wang, Zu Rong Dai, Ruiping Gao, and James L. Gole

Measuring the Young's modulus of solid nanowires by in situ TEM
J Electron Microsc (Tokyo) 2002 51: S79-S85; doi:10.1093/jmicro/51.Supplement.S79 [Abstract] [PDF]  

Takeshi Omura, Masashi Watanabe, and Yoshitsugu Tomokiyo

Quantitative evaluation of zero-loss and core-loss images by using EF-TEM
J Electron Microsc (Tokyo) 2002 51: S87-S96; doi:10.1093/jmicro/51.Supplement.S87 [Abstract] [PDF]  

Bryan W. Reed and Mehmet Sarikaya

TEM/EELS analysis of heat-treated carbon nanotubes: experimental techniques
J Electron Microsc (Tokyo) 2002 51: S97-S105; doi:10.1093/jmicro/51.Supplement.S97 [Abstract] [PDF]  

Isao Tanaka, Teruyasu Mizoguchi, Masato Yoshiya, Kazuyoshi Ogasawara, Hirohiko Adachi, Shang-Di Mo, and Wai Yim Ching

First principles calculation of ELNES by LCAO methods
J Electron Microsc (Tokyo) 2002 51: S107-S112; doi:10.1093/jmicro/51.Supplement.S107 [Abstract] [PDF]  

David B. Williams, Adam J. Papworth, and Masashi Watanabe

High resolution X-ray mapping in the STEM
J Electron Microsc (Tokyo) 2002 51: S113-S126; doi:10.1093/jmicro/51.Supplement.S113 [Abstract] [PDF]  

Hiroki Tanaka, Akiko Sadakata, Masashi Watanabe, Yoshitsugu Tomokiyo, Nobuhiko Nishimura, and Masashi Ozaki

Application of a JEM-2010FEF FEG-AEM for elemental analysis of microstructures in heat-resisting Cr steel
J Electron Microsc (Tokyo) 2002 51: S127-S134; doi:10.1093/jmicro/51.Supplement.S127 [Abstract] [PDF]  

Yasuyuki Kitano, Kazushi Yamada, Eishi Tanabe, Muneo Oka, and Kousou Nagao

TEM and AEM observation of high-strain-rate superplastic ceramics, CaO-/TiO₂-doped and CaO-/SiO₂-doped (3Y)ZrO₂ polycrystals
J Electron Microsc (Tokyo) 2002 51: S135-S141; doi:10.1093/jmicro/51.Supplement.S135 [Abstract] [PDF]  

Eiichi Sukedai, Hajime Matsumoto, and Hatsujiro Hashimoto

Electron microscopy study on Mo content dependence of ß to phase transformation due to cooling in Ti–Mo alloys
J Electron Microsc (Tokyo) 2002 51: S143-S147; doi:10.1093/jmicro/51.Supplement.S143 [Abstract] [PDF]  

Guoqiang Xie, Osamu Ohashi, Minghui Song, Kazutaka Mitsuishi, Hidehiro Yasuda, Kazuo Furuya, and Tetsuji Noda

Electron microscopic observation of interfaces of aluminium powder compacts prepared by spark plasma sintering
J Electron Microsc (Tokyo) 2002 51: S149-S153; doi:10.1093/jmicro/51.Supplement.S149 [Abstract] [PDF]  

Jun Xu, Yoshio Matsui, Tsuyoshi Kimura, and Yoshinori Tokura

Dark-field and bright-field imaging of charge order domains in Nd_0.5Ca_0.5(Mn_0.98Cr_0.02)O₃
J Electron Microsc (Tokyo) 2002 51: S155-S158; doi:10.1093/jmicro/51.Supplement.S155 [Abstract] [PDF]  

Kenya Nagahisa, Makoto Yoshida, Eiji Abe, Hideharu Fukunaga, and Gen Sasaki

HREM and EDS analysis of sintered SiC fibre reinforced MAS glass composites
J Electron Microsc (Tokyo) 2002 51: S159-S164; doi:10.1093/jmicro/51.Supplement.S159 [Abstract] [PDF]  

Sung-Hwan Lim and Daisuke Shindo

High-resolution electron microscopy of stacking faults in heteroepitaxial ZnO/LiTaO₃
J Electron Microsc (Tokyo) 2002 51: S165-S169; doi:10.1093/jmicro/51.Supplement.S165 [Abstract] [PDF]  

Sung-Hwan Lim, Jack Washburn, and Zuzanna Liliental-Weber

Transmission electron microscopy analysis of interfacial layers in Ti/Ta/Al ohmic contacts to n-AlGaN
J Electron Microsc (Tokyo) 2002 51: S171-S174; doi:10.1093/jmicro/51.Supplement.S171 [Abstract] [PDF]  

Charles W. Allen, Robert C. Birtcher, Stephen E. Donnelly, Minghui Song, Kazuo Furuya, Nobuhiro Ishikawa, and Kazutaka Mitsuishi

Melting and crystallization of Xe nanoprecipitates in Al under 1 MeV electron irradiation
J Electron Microsc (Tokyo) 2002 51: S175-S181; doi:10.1093/jmicro/51.Supplement.S175 [Abstract] [PDF]  

Hiroaki Abe, Shunya Yamamoto, and Atsumi Miyashita

In situ TEM observation of nucleation and growth of spherical graphitic clusters under ion implantation
J Electron Microsc (Tokyo) 2002 51: S183-S187; doi:10.1093/jmicro/51.Supplement.S183 [Abstract] [PDF]  

Florian Banhart

The role of lattice defects in the formation of new carbon structures under electron irradiation
J Electron Microsc (Tokyo) 2002 51: S189-S194; doi:10.1093/jmicro/51.Supplement.S189 [Abstract] [PDF]  

Jung Goo Lee, Eiji Taguchi, and Hirotaro Mori

Implantation of Au atoms into Al matrix by MeV electron irradiation
J Electron Microsc (Tokyo) 2002 51: S195-S200; doi:10.1093/jmicro/51.Supplement.S195 [Abstract] [PDF]  

Erik Johnson, Allan Johansen, Chris Nelson, and Ulrich Dahmen

Nanoscale lead-tin inclusions in aluminium
J Electron Microsc (Tokyo) 2002 51: S201-S209; doi:10.1093/jmicro/51.Supplement.S201 [Abstract] [PDF]  

Minghui Song, Kazutaka Mitsuishi, Hidehiro Yasuda, and Kazuo Furuya

Dynamic process of nano-structured inert gas precipitates introduced with ion implantation in aluminium
J Electron Microsc (Tokyo) 2002 51: S211-S214; doi:10.1093/jmicro/51.Supplement.S211 [Abstract] [PDF]  

Hidehiro Yasuda, Masaki Takeguchi, Kazutaka Mitsuishi, Miyoko Tanaka, Minghui Song, Kazuo Furuya, and Hirotaro Mori

Amorphous-like nanostructures stabilized in nanometre-sized alloy clusters
J Electron Microsc (Tokyo) 2002 51: S215-S218; doi:10.1093/jmicro/51.Supplement.S215 [Abstract] [PDF]  

Manabu Ishimaru, Yoshihiko Hirotsu, and Kurt E. Sickafus

Ion-beam-induced structural changes in MgAl₂O₄ and TiO₂
J Electron Microsc (Tokyo) 2002 51: S219-S224; doi:10.1093/jmicro/51.Supplement.S219 [Abstract] [PDF]  

Kazuto Arakawa, Shigeo Arai, Hiroshi Orihara, Kotaro Ono, and Michio Kiritani

A study of the mechanism of the growth and shrinkage of stacking fault tetrahedra using the fluctuation of their size under electron irradiation
J Electron Microsc (Tokyo) 2002 51: S225-S229; doi:10.1093/jmicro/51.Supplement.S225 [Abstract] [PDF]  

Fengmin Chu, Minghui Song, Kazutaka Mitsuishi, Hidehiro Yasuda, and Kazuo Furuya

Temperature effect on ion irradiation-induced phase transformation in 304 stainless steel
J Electron Microsc (Tokyo) 2002 51: S231-S234; doi:10.1093/jmicro/51.Supplement.S231 [Abstract] [PDF]  

Masato Sasase, Satoru Okayasu, Hiroki Kurata, and Kiichi Hojou

Defect structure of high-T_c superconductor by high-energy heavy ion irradiation
J Electron Microsc (Tokyo) 2002 51: S235-S238; doi:10.1093/jmicro/51.Supplement.S235 [Abstract] [PDF]  

Eiichi Wakai, Tomotsugu Sawai, Akira Naito, and Shiro Jitsukawa

Microstructural development and swelling behaviour of F82H steel irradiated by dual ion beams
J Electron Microsc (Tokyo) 2002 51: S239-S243; doi:10.1093/jmicro/51.Supplement.S239 [Abstract] [PDF]  

Kotaro Ono, Kazuto Arakawa, Kiichi Hojou, Masahiro Oohasi, Robert C. Birtcher, and Stephen E. Donnelly

Quantitative study of Brownian motion of helium bubbles in fcc metals
J Electron Microsc (Tokyo) 2002 51: S245-S251; doi:10.1093/jmicro/51.Supplement.S245 [Abstract] [PDF]  

Kiyokazu Yoshida, Hirotaro Mori, Shinji Shimojo, Youki Kadobayashi, Toyokazu Akiyama, and Mark H. Ellisman

Design of a remote operation system for trans-Pacific microscopy via international advanced networks
J Electron Microsc (Tokyo) 2002 51: S253-S257; doi:10.1093/jmicro/51.Supplement.S253 [Abstract] [PDF]  

Renzhi Ma, Yoshio Bando, and Tadao Sato

Bamboo-like boron nitride nanotubes
J Electron Microsc (Tokyo) 2002 51: S259-S263; doi:10.1093/jmicro/51.Supplement.S259 [Abstract] [PDF]  

Koji Tanaka and Masanori Kohyama

Atomic and electronic structure analysis of = 3 incoherent twin boundaries in ß-SiC
J Electron Microsc (Tokyo) 2002 51: S265-S270; doi:10.1093/jmicro/51.Supplement.S265 [Abstract] [PDF]  

D. X. Li, M. G. Wang, and H. Q. Ye

Characterization of the microstructure in CMR materials by HREM
J Electron Microsc (Tokyo) 2002 51: S271-S278; doi:10.1093/jmicro/51.Supplement.S271 [Abstract] [PDF]  

Chris B. Boothroyd

Quantification of lattice images: the contribution from diffuse scattering
J Electron Microsc (Tokyo) 2002 51: S279-S287; doi:10.1093/jmicro/51.Supplement.S279 [Abstract] [PDF]  

To see an article, click its [Full Text] or [PDF] link. To review many abstracts, check the boxes to the left of the titles you want, and click the 'Get All Checked Abstract(s)' button. To see one abstract at a time, click its [Abstract] link.