Journal of Electron Microscopy

Editorials:

Hideki Ichinose

Editorial
J Electron Microsc (Tokyo) 2003 52: 1; doi:10.1093/jmicro/52.1.1 [PDF] [Request Permissions]  

Full-length papers:

Fumio Hosokawa, Takeshi Tomita, Mikio Naruse, Toshikazu Honda, Peter Hartel, and Max Haider

A spherical aberration-corrected 200 kV TEM
J Electron Microsc (Tokyo) 2003 52: 3-10; doi:10.1093/jmicro/52.1.3 [Abstract] [PDF] [Request Permissions]  

Akira Tonomura

Applications of 1 MV field-emission transmission electron microscope
J Electron Microsc (Tokyo) 2003 52: 11-19; doi:10.1093/jmicro/52.1.11 [Abstract] [PDF] [Request Permissions]  

Satoshi Ichikawa, Tomoki Akita, Mitsutaka Okumura, Masatake Haruta, Koji Tanaka, and Masanori Kohyama

Electron holographic 3-D nano-analysis of Au/TiO₂ catalyst at interface
J Electron Microsc (Tokyo) 2003 52: 21-26; doi:10.1093/jmicro/52.1.21 [Abstract] [PDF] [Request Permissions]  

Kenji Murakami, Mitsuhiro Saito, Eriko Takuma, and Hideki Ichinose

ARHVTEM of the Pd/ZnO heterointerface chemical structure
J Electron Microsc (Tokyo) 2003 52: 27-32; doi:10.1093/jmicro/52.1.27 [Abstract] [PDF] [Request Permissions]  

Seiichi Watanabe, Misaki Hoshino, Takuto Koike, Takanori Suda, Soumei Ohnuki, Heishichirou Takahashi, and Nighi Q. Lam

Atomistic observation and simulation analysis of spatio-temporal fluctuations during radiation-induced amorphization
J Electron Microsc (Tokyo) 2003 52: 33-40; doi:10.1093/jmicro/52.1.33 [Abstract] [PDF] [Request Permissions]  

María Hernando, Khalid Boulahya, Aurea Varela, Marina Parras, and José M. González-Calbet

Influence of Sr-doping in Ba₇Rh₆O₁₈, a new one-dimensional oxide of the homologous series (A₃Rh₂O₆)(A₃Rh₃O₉)_ß
J Electron Microsc (Tokyo) 2003 52: 41-47; doi:10.1093/jmicro/52.1.41 [Abstract] [PDF] [Request Permissions]  

Yoshifumi Oshima, Yukihito Kondo, and Kunio Takayanagi

High-resolution ultrahigh-vacuum electron microscopy of helical gold nanowires: junction and thinning process
J Electron Microsc (Tokyo) 2003 52: 49-55; doi:10.1093/jmicro/52.1.49 [Abstract] [PDF] [Request Permissions]  

Jung-Goo Lee and Hirotaro Mori

In situ HREM study on the structural instability of isolated nanometre-sized alloy particles in the Sn-Bi system
J Electron Microsc (Tokyo) 2003 52: 57-62; doi:10.1093/jmicro/52.1.57 [Abstract] [PDF] [Request Permissions]  

Yuichiro Sueishi, Norihito Sakaguchi, Tamaki Shibayama, Hiroshi Kinoshita, and Heishichiro Takahashi

Radiation-induced segregation and precipitation behaviours around cascade clusters under electron irradiation
J Electron Microsc (Tokyo) 2003 52: 63-68; doi:10.1093/jmicro/52.1.63 [Abstract] [PDF] [Request Permissions]  

Nobuo Tanaka, Jun Yamasaki, Koji Usuda, and Nobuyuki Ikarashi

First observation of SiO₂/Si(100) interfaces by spherical aberration-corrected high-resolution transmission electron microscopy
J Electron Microsc (Tokyo) 2003 52: 69-73; doi:10.1093/jmicro/52.1.69 [Abstract] [PDF] [Request Permissions]  

Tamaki Shibayama, Yutaka Yoshida, Yasuhide Yano, and Heishichiro Takahashi

Creep deformation of grain boundary in a highly crystalline SiC fibre
J Electron Microsc (Tokyo) 2003 52: 75-78; doi:10.1093/jmicro/52.1.75 [Abstract] [PDF] [Request Permissions]  

Shigeo Arai, Susumu Tsukimoto, and Hiroyasu Saka

In situ HREM observation of nucleation and growth of nanotwins beneath the solid–liquid interface in Si
J Electron Microsc (Tokyo) 2003 52: 79-84; doi:10.1093/jmicro/52.1.79 [Abstract] [PDF] [Request Permissions]  

Takashi Kobayashi, Tetsuya Ogawa, Sakumi Moriguchi, Takeo Suga, Kaname Yoshida, Hiroki Kurata, and Seiji Isoda

Inhomogeneous substitution of polyhalogenated copper-phthalocyanine studied by high-resolution imaging and electron crystallography
J Electron Microsc (Tokyo) 2003 52: 85-90; doi:10.1093/jmicro/52.1.85 [Abstract] [PDF] [Request Permissions]  

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