Journal of Electron Microscopy

Preface:

Daisuke Fujita and Nobuo Tanaka

Preface
J Electron Microsc (Tokyo) 2004 53: 99; doi:10.1093/jmicro/53.2.99 [PDF] [Request Permissions]  

Full-length papers:

John L. Hutchison, Jeremy Sloan, Angus I. Kirkland, and Malcolm L. H. Green

Growing and characterizing one-dimensional crystals within single-walled carbon nanotubes
J Electron Microsc (Tokyo) 2004 53: 101-106; doi:10.1093/jmicro/53.2.101 [Abstract] [PDF] [Request Permissions]  

James M. Howe, Takeshi Yokota, Mitsuhiro Murayama, and William A. Jesser

Effects of heat and electron irradiation on the melting behavior of Al–Si alloy particles and motion of the Al nanosphere within
J Electron Microsc (Tokyo) 2004 53: 107-114; doi:10.1093/jmicro/53.2.107 [Abstract] [PDF] [Request Permissions]  

Zhou-Guang Wang, Naoko Kato, Katsuhiro Sasaki, Tsukasa Hirayama, and Hiroyasu Saka

Electron holographic mapping of two-dimensional doping areas in cross-sectional device specimens prepared by the lift-out technique based on a focused ion beam
J Electron Microsc (Tokyo) 2004 53: 115-119; doi:10.1093/jmicro/53.2.115 [Abstract] [PDF] [Request Permissions]  

Seiichiro Ii, Chihiro Iwamoto, Katsuyuki Matsunaga, Takahisa Yamamoto, and Yuichi Ikuhara

Identification of crack path of inter- and transgranular fractures in sintered silicon nitride by in situ TEM
J Electron Microsc (Tokyo) 2004 53: 121-127; doi:10.1093/jmicro/53.2.121 [Abstract] [PDF] [Request Permissions]  

Jun Yamasaki, Tomoyuki Kawai, and Nobuo Tanaka

Direct observation of a stacking fault in Si_1–xGe_x semiconductors by spherical aberration-corrected TEM and conventional ADF-STEM
J Electron Microsc (Tokyo) 2004 53: 129-135; doi:10.1093/jmicro/53.2.129 [Abstract] [PDF] [Request Permissions]  

Katsunori Ohshima, Kenji Kaneko, Takeshi Fujita, and Zenji Horita

Determination of absolute thickness and mean free path of thin foil specimen by -factor method
J Electron Microsc (Tokyo) 2004 53: 137-142; doi:10.1093/jmicro/53.2.137 [Abstract] [PDF] [Request Permissions]  

Zhi-Quan Liu, Minghui Song, Kazutaka Mitsuishi, Kazuo Furuya, and Hatsujiro Hashimoto

Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering
J Electron Microsc (Tokyo) 2004 53: 143-148; doi:10.1093/jmicro/53.2.143 [Abstract] [PDF] [Request Permissions]  

Shoichi Toh, Kenji Kaneko, Yasuhiko Hayashi, Tomoharu Tokunaga, and Won-Jin Moon

Microstructure of metal-filled carbon nanotubes
J Electron Microsc (Tokyo) 2004 53: 149-155; doi:10.1093/jmicro/53.2.149 [Abstract] [PDF] [Request Permissions]  

Airu Wang, Osamu Ohashi, Norio Yamaguchi, Guoqiang Xie, Minghui Song, Kazuo Furuya, Yasuo Higashi, and Nobuteru Hitomi

Electron microscopy observation of interface in diffusion-bonded copper joint
J Electron Microsc (Tokyo) 2004 53: 157-161; doi:10.1093/jmicro/53.2.157 [Abstract] [PDF] [Request Permissions]  

Seizo Morita, Yoshiaki Sugimoto, Noriaki Oyabu, Ryuji Nishi, Óscar Custance, Yasuhiro Sugawara, and Masayuki Abe

Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
J Electron Microsc (Tokyo) 2004 53: 163-168; doi:10.1093/jmicro/53.2.163 [Abstract] [PDF] [Request Permissions]  

Tohru Tsuruoka and Sukekatsu Ushioda

Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope
J Electron Microsc (Tokyo) 2004 53: 169-175; doi:10.1093/jmicro/53.2.169 [Abstract] [PDF] [Request Permissions]  

Daisuke Fujita, Mingxiang Xu, Keiko Onishi, Masayo Kitahara, and Keisuke Sagisaka

Novel local density of state mapping technique for low-dimensional systems
J Electron Microsc (Tokyo) 2004 53: 177-185; doi:10.1093/jmicro/53.2.177 [Abstract] [PDF] [Request Permissions]  

Fritz Keilmann

Scattering-type near-field optical microscopy
J Electron Microsc (Tokyo) 2004 53: 187-192; doi:10.1093/jmicro/53.2.187 [Abstract] [PDF] [Request Permissions]  

Toshiharu Saiki, Kazunari Matsuda, Shintaro Nomura, Masaru Mihara, Yoshinobu Aoyagi, Selvakumar Nair, and Toshihide Takagahara

Nano-optical probing of exciton wave-functions confined in a GaAs quantum dot
J Electron Microsc (Tokyo) 2004 53: 193-201; doi:10.1093/jmicro/53.2.193 [Abstract] [PDF] [Request Permissions]  

Takashi Sekiguchi, Junqing Hu, and Yoshio Bando

Cathodoluminescence study of one-dimensional free-standing widegap-semiconductor nanostructures: GaN nanotubes, Si₃N₄ nanobelts and ZnS/Si nanowires
J Electron Microsc (Tokyo) 2004 53: 203-208; doi:10.1093/jmicro/53.2.203 [Abstract] [PDF] [Request Permissions]  

Tadashi Mitsui and Takashi Sekiguchi

Observation of polarization property in near-field optical imaging by a polarization-maintaining fiber probe
J Electron Microsc (Tokyo) 2004 53: 209-215; doi:10.1093/jmicro/53.2.209 [Abstract] [PDF] [Request Permissions]  

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