Journal of Electron Microscopy

Physical papers: Full-length papers:

Kenichi Nishinaka, Shinsuke Taka, Yoshihide Kimura, and Yoshizo Takai

Development of coincidence transmission electron microscope. III. Incorporation with -type imaging energy filter
J Electron Microsc (Tokyo) 2004 53: 217-222; doi:10.1093/jmicro/53.3.217 [Abstract] [PDF] [Request Permissions]  

Shinichi Igarashi, Masaharu Haraguchi, Jun Aihara, Takeru Saito, Kenji Yamaguchi, Hiroyuki Yamamoto, and Kiichi Hojou

Observation of iron silicide formation by plan-view transmission electron microscopy
J Electron Microsc (Tokyo) 2004 53: 223-228; doi:10.1093/jmicro/53.3.223 [Abstract] [PDF] [Request Permissions]  

Kaoru Ohya and Tohru Ishitani

Monte Carlo simulation of topographic contrast in scanning ion microscope
J Electron Microsc (Tokyo) 2004 53: 229-235; doi:10.1093/jmicro/53.3.229 [Abstract] [PDF] [Request Permissions]  

Andrey Chuvilin, Thomas Kups, and Ute Kaiser

The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination
J Electron Microsc (Tokyo) 2004 53: 237-244; doi:10.1093/jmicro/53.3.237 [Abstract] [PDF] [Request Permissions]  

Tohru Ishitani and Mitsugu Sato

Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy
J Electron Microsc (Tokyo) 2004 53: 245-255; doi:10.1093/jmicro/53.3.245 [Abstract] [PDF] [Request Permissions]  

Yiping Peng, Peter D. Nellist, and Stephen J. Pennycook

HAADF-STEM imaging with sub-angstrom probes: a full Bloch wave analysis
J Electron Microsc (Tokyo) 2004 53: 257-266; doi:10.1093/jmicro/53.3.257 [Abstract] [PDF] [Request Permissions]  

Young-Gil Park, Jun-Mo Yang, and Daisuke Shindo

Analytical electron microscopy and electron holography on microstructures and magnetic domain structures of Sm-Co 2:17 magnets
J Electron Microsc (Tokyo) 2004 53: 267-270; doi:10.1093/jmicro/53.3.267 [Abstract] [PDF] [Request Permissions]  

Note:

Tadahiro Kawasaki, Masaki Taya, and Yoshizo Takai

Practical method to determine the filter shape function used in the three-dimensional Fourier filtering method
J Electron Microsc (Tokyo) 2004 53: 271-275; doi:10.1093/jmicro/53.3.271 [Abstract] [PDF] [Request Permissions]  

Letters:

Hee-Joo Eo, Jun-Mo Yang, Tae-Su Park, Jong-Pill Lee, Won Kim, Ju-Chul Park, and Soun-Young Lee

Chemical junction delineation of a specific site in Si devices
J Electron Microsc (Tokyo) 2004 53: 277-280; doi:10.1093/jmicro/53.3.277 [Abstract] [PDF] [Request Permissions]  

Anindito Sen, Ranjan K. Nandy, and Amar N. Ghosh

Elasticity of flagellar hooks
J Electron Microsc (Tokyo) 2004 53: 305-309; doi:10.1093/jmicro/53.3.305 [Abstract] [PDF] [Request Permissions]  

Biological papers: Full-length papers:

Jacob S. Ishay, Vitaly Pertsis, Ehud Skutelsky, Dharamdajal Kalicharan, and Hans van der Want

Ontogenesis of peripheral electromagnetic receptors in hornets
J Electron Microsc (Tokyo) 2004 53: 281-291; doi:10.1093/jmicro/53.3.281 [Abstract] [PDF] [Request Permissions]  

Zmira Joseph and Jacob S. Ishay

Silk structure in the hornet cocoon
J Electron Microsc (Tokyo) 2004 53: 293-304; doi:10.1093/jmicro/53.3.293 [Abstract] [PDF] [Request Permissions]  

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