Journal of Electron Microscopy

Editorial:

Hiroyasu Saka and Hideki Ichinose

Editorial
J Electron Microsc (Tokyo) 2004 53: 441; doi:10.1093/jmicro/dfh095 [PDF] [Request Permissions]  

Full-length papers:

Tohru Ishitani, Kaoru Umemura, Tsuyoshi Ohnishi, Toshie Yaguchi, and Takeo Kamino

Improvements in performance of focused ion beam cross-sectioning: aspects of ion-sample interaction
J Electron Microsc (Tokyo) 2004 53: 443-449; doi:10.1093/jmicro/dfh078 [Abstract] [PDF] [Request Permissions]  

Naoko I. Kato

Reducing focused ion beam damage to transmission electron microscopy samples
J Electron Microsc (Tokyo) 2004 53: 451-458; doi:10.1093/jmicro/dfh080 [Abstract] [PDF] [Request Permissions]  

Takeo Kamino, Toshie Yaguchi, Yasushi Kuroda, Tsuyoshi Ohnishi, Tohru Ishitani, Yuichi Miyahara, and Zenji Horita

Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10 kV and 40 kV
J Electron Microsc (Tokyo) 2004 53: 459-463; doi:10.1093/jmicro/dfh058 [Abstract] [PDF] [Request Permissions]  

Satoshi Tsuji, Katsuhiro Tsujimoto, Kotaro Kuroda, and Hiroyasu Saka

Application of focused ion beam techniques and transmission electron microscopy to thin-film transistor failure analysis
J Electron Microsc (Tokyo) 2004 53: 465-470; doi:10.1093/jmicro/dfh090 [Abstract] [PDF] [Request Permissions]  

Yasufumi Yabuuchi, Sayoko Tametou, Tetsuyuki Okano, Sachiko Inazato, Shoji Sadayama, Yoh Yamamoto, Koji Iwasaki, and Yasuhiko Sugiyama

A study of the damage on FIB-prepared TEM samples of Al_xGa_1–xAs
J Electron Microsc (Tokyo) 2004 53: 471-477; doi:10.1093/jmicro/dfh062 [Abstract] [PDF] [Request Permissions]  

Muneyuki Fukuda, Satoshi Tomimatsu, Kuniyasu Nakamura, Masanari Koguchi, Hiroyasu Shichi, and Kaoru Umemura

A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
J Electron Microsc (Tokyo) 2004 53: 479-483; doi:10.1093/jmicro/dfh059 [Abstract] [PDF] [Request Permissions]  

Shoji Sadayama, Yasuhiko Sugiyama, Koji Iwasaki, and Anto Yasaka

Post-thinning technique for a lifted-out membrane
J Electron Microsc (Tokyo) 2004 53: 493-496; doi:10.1093/jmicro/dfh085 [Abstract] [PDF] [Request Permissions]  

Takeharu Kato, Takemi Muroga, Yasuhiro Iijima, Takashi Saitoh, Yutaka Yamada, Teruo Izumi, Yuh Shiohara, Tsukasa Hirayama, and Yuichi Ikuhara

A new method for preparing plan-view TEM specimen of multilayered films using focused ion beam
J Electron Microsc (Tokyo) 2004 53: 501-504; doi:10.1093/jmicro/dfh065 [Abstract] [PDF] [Request Permissions]  

Masaki Tanaka, Kenji Higashida, Toru Fukui, and Tatsuo Yokote

HVEM study of crack-tip dislocations in Si crystals prepared by FIB and twin-blade cutting method
J Electron Microsc (Tokyo) 2004 53: 505-509; doi:10.1093/jmicro/dfh052 [Abstract] [PDF] [Request Permissions]  

Kyeong Hwan Park, Hirotatsu Kishimoto, and Akira Kohyama

3D analysis of cracking behaviour under indentation in ion-irradiated ß-SiC
J Electron Microsc (Tokyo) 2004 53: 511-513; doi:10.1093/jmicro/dfh079 [Abstract] [PDF] [Request Permissions]  

Satoru Ohsaki, Kazuhiro Hono, Hideyuki Hidaka, and Setsuo Takaki

Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder
J Electron Microsc (Tokyo) 2004 53: 523-525; doi:10.1093/jmicro/dfh054 [Abstract] [PDF] [Request Permissions]  

Satoshi Hata, Kohjiro Shiraishi, Masaru Itakura, Noriyuki Kuwano, Takayoshi Nakano, and Yukichi Umakoshi

Application of FIB microsampling technique to long-period ordered TiAl single crystal with composition gradient
J Electron Microsc (Tokyo) 2004 53: 537-540; doi:10.1093/jmicro/dfh049 [Abstract] [PDF] [Request Permissions]  

Moon-Hi Hong and Hiroyasu Saka

FIB and TEM Observations of Defects in Hot-Dip Zinc Coatings
J Electron Microsc (Tokyo) 2004 53: 545-552; doi:10.1093/jmicro/dfh053 [Abstract] [PDF] [Request Permissions]  

Kaoru Sato, Michitaka Sakurai, Shoichiro Taira, and Etsuo Hamada

Plan-view and cross-sectional characterization of thiourea-treated phosphorus-added steel surface
J Electron Microsc (Tokyo) 2004 53: 553-556; doi:10.1093/jmicro/dfh060 [Abstract] [PDF] [Request Permissions]  

Koji Kobayashi and Hiroyasu Saka

Microstructures of galvannealing coats plated on an iron substrate deformed by indentation
J Electron Microsc (Tokyo) 2004 53: 557-561; doi:10.1093/jmicro/dfh083 [Abstract] [PDF] [Request Permissions]  

Yukinori Hirose, Naoto Hashikawa, Koji Fukumoto, and Yoji Mashiko

Microsampling technique for EBSP inspection on the cross-sections of copper trench lines in ULSIs
J Electron Microsc (Tokyo) 2004 53: 567-570; doi:10.1093/jmicro/dfh061 [Abstract] [PDF] [Request Permissions]  

Y. Yahiro, K. Kaneko, T. Fujita, W.-J. Moon, and Z. Horita

Crystallographic orientation contrast associated with Ga⁺ ion channelling for Fe and Cu in focused ion beam method
J Electron Microsc (Tokyo) 2004 53: 571-576; doi:10.1093/jmicro/dfh075 [Abstract] [PDF] [Request Permissions]  

Notes:

Yuko Kobayashi, Young-Gil Park, Daisuke Shindo, and Shin Tajima

Transmission electron microscopy on thin film of high density magnetic composite prepared by FIB method
J Electron Microsc (Tokyo) 2004 53: 485-487; doi:10.1093/jmicro/dfh072 [Abstract] [PDF] [Request Permissions]  

Noriyuki Kuwano, Jia-Yu, Ryota Tajima, Shin-ichi Koga, Shuya Tsukamoto, and Yasuhide Ohno

Application of a focused ion beam mill to the characterisation of a microstructure in tin plating on a Fe 42wt% Ni substrate
J Electron Microsc (Tokyo) 2004 53: 541-544; doi:10.1093/jmicro/dfh064 [Abstract] [PDF] [Request Permissions]  

Takeo Kamino, Toshie Yaguchi, Tsuyoshi Ohnishi, Tohru Ishitani, and Masako Osumi

Application of a FIB–STEM system for 3D observation of a resin-embedded yeast cell
J Electron Microsc (Tokyo) 2004 53: 563-566; doi:10.1093/jmicro/dfh063 [Abstract] [PDF] [Request Permissions]  

Letters:

Zhouguang Wang, Takeharu Kato, and Tsukasa Hirayama

Side-milling technique of preparing device cross-sections for electron holography based on a focused ion beam micro-sampling system
J Electron Microsc (Tokyo) 2004 53: 489-491; doi:10.1093/jmicro/dfh050 [Abstract] [PDF] [Request Permissions]  

Hirokazu Sasaki, Takeyoshi Matsuda, Takeharu Kato, Takemi Muroga, Yasuhiro Iijima, Takashi Saitoh, Fusako Iwase, Yutaka Yamada, Teruo Izumi, Yuh Shiohara, and Tsukasa Hirayama

Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling
J Electron Microsc (Tokyo) 2004 53: 497-500; doi:10.1093/jmicro/dfh067 [Abstract] [PDF] [Request Permissions]  

Hirotatsu Kishimoto, Kyeong-Hwan Park, Sosuke Kondo, Kazumi Ozawa, and Akira Kohyama

Microstructural analysis of the deformation range under nano-indentation in ß-SiC
J Electron Microsc (Tokyo) 2004 53: 515-517; doi:10.1093/jmicro/dfh073 [Abstract] [PDF] [Request Permissions]  

Reviews:

Kazumi Ozawa, Sosuke Kondo, Hirotatsu Kishimoto, and Akira Kohyama

Application of FIB with micro pick-up to microstructural study of irradiated SiC/SiC composites
J Electron Microsc (Tokyo) 2004 53: 519-521; doi:10.1093/jmicro/dfh081 [Abstract] [PDF] [Request Permissions]  

Masaaki Sugiyama and Genichi Sigesato

A review of focused ion beam technology and its applications in transmission electron microscopy
J Electron Microsc (Tokyo) 2004 53: 527-536; doi:10.1093/jmicro/dfh071 [Abstract] [PDF] [Request Permissions]  

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