Journal of Electron Microscopy

Physical papers: Full-length papers:

Kaoru Shoda, Tohoru Matsubara, and Seiji Takeda

Analysis of grain boundaries in CoCrTa and CoPtCrB HDD media by analytical transmission electron microscopy
J Electron Microsc (Tokyo) 2005 54: 1-9; doi:10.1093/jmicro/dfh047 [Abstract] [PDF] [Request Permissions]  

Daisuke Shindo, Takayuki Musashi, Yoichi Ikematsu, Yasukazu Murakami, Norikazu Nakamura, and Hiroshi Chiba

Characterization of DLC films by EELS and electron holography
J Electron Microsc (Tokyo) 2005 54: 11-17; doi:10.1093/jmicro/dfh096 [Abstract] [PDF] [Request Permissions]  

Ken Harada, Tetsuya Akashi, Yoshihiko Togawa, Tsuyoshi Matsuda, and Akira Tonomura

Optical system for double-biprism electron holography
J Electron Microsc (Tokyo) 2005 54: 19-27; doi:10.1093/jmicro/dfh098 [Abstract] [PDF] [Request Permissions]  

Toshio Yamamoto, Noriyuki Nagaoka, Azumi Hirata, Hiroaki Nakamura, Miho Inoue, Mariko Kawai, and Mika Ikegame

Ultrastructural and immunohistochemical studies of medullary bone calcification, with special reference to sulphated glycosaminoglycans
J Electron Microsc (Tokyo) 2005 54: 29-34; doi:10.1093/jmicro/dfh097 [Abstract] [PDF] [Request Permissions]  

Sujeong Lee, Yoon Joong Kim, Hyeong-Tae Jou, and Hi-Soo Moon

Lattice parameter determination of mullite by energy-filtered needle-texture electron diffraction pattern
J Electron Microsc (Tokyo) 2005 54: 35-41; doi:10.1093/jmicro/dfh099 [Abstract] [PDF] [Request Permissions]  

Herbert Mucha, Takeharu Kato, Shigeo Arai, Hiroyasu Saka, Kotaro Kuroda, and Bernhard Wielage

Focused ion beam preparation techniques dedicated for the fabrication of TEM lamellae of fibre-reinforced composites
J Electron Microsc (Tokyo) 2005 54: 43-49; doi:10.1093/jmicro/dfh102 [Abstract] [PDF] [Request Permissions]  

Tsukasa Hirayama, Kazuo Yamamoto, Kimiya Miyashita, and Tomohiro Saito

Amplitude-division three-electron-wave interference for observing pure phase objects having low spatial frequency
J Electron Microsc (Tokyo) 2005 54: 51-55; doi:10.1093/jmicro/dfh103 [Abstract] [PDF] [Request Permissions]  

Note:

Chunfei Li and David B. Williams

A new TEM method of interfacial thin-film characterization
J Electron Microsc (Tokyo) 2005 54: 57-60; doi:10.1093/jmicro/dfh101 [Abstract] [PDF] [Request Permissions]  

Letters:

Xiuzhen Yu, Toru Asaka, Yasuhide Tomioka, Chusei Tsuruta, Takuro Nagai, Koji Kimoto, Yoshio Kaneko, Yoshinori Tokura, and Yoshio Matsui

TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba₂FeMoO₆
J Electron Microsc (Tokyo) 2005 54: 61-65; doi:10.1093/jmicro/dfh104 [Abstract] [PDF] [Request Permissions]  

Yasuko Kaneko, Radostin Danev, Koji Nitta, and Kuniaki Nagayama

In vivo subcellular ultrastructures recognized with Hilbert differential contrast transmission electron microscopy
J Electron Microsc (Tokyo) 2005 54: 79-84; doi:10.1093/jmicro/dfh105 [Abstract] [PDF] [Request Permissions]  

Biological paper: Full-length paper:

Yayoi Nishiyama, Yayoi Hasumi, Kumiko Ueda, Katsuhisa Uchida, and Hideyo Yamaguchi

Effects of micafungin on the morphology of Aspergillus fumigatus
J Electron Microsc (Tokyo) 2005 54: 67-77; doi:10.1093/jmicro/dfh100 [Abstract] [PDF] [Request Permissions]  

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