Journal of Electron Microscopy

Foreword:

Hideki Ichinose and David J. Smith

Foreword
J Electron Microsc (Tokyo) 2005 54: 147; doi:10.1093/jmicro/54.3.147 [Full Text] [PDF] [Request Permissions]  

Articles:

Sumio Iijima

In Memory of the late Professor John M. Cowley
J Electron Microsc (Tokyo) 2005 54: 149; doi:10.1093/jmicro/54.3.149 [Full Text] [PDF] [Request Permissions]  

J. A. Venables, G. G. Hembree, J. Drucker, P. A. Crozier, and M. R. Scheinfein

The MIDAS project at ASU: John Cowley's vision and practical results
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 151-162; doi:10.1093/jmicro/dfi038 [Abstract] [Full Text] [PDF] [Request Permissions]  

John C H Spence

Electron diffraction from laser-aligned beams of large hydrated molecules
J Electron Microsc (Tokyo) 2005 54: 163-168; doi:10.1093/jmicro/54.3.163 [Abstract] [Full Text] [PDF] [Request Permissions]  

Michael A. O'Keefe, Lawrence F. Allard, and Douglas A. Blom

HRTEM imaging of atoms at sub-Ångström resolution
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 169-180; doi:10.1093/jmicro/dfi036 [Abstract] [Full Text] [PDF] [Request Permissions]  

F. Hüe, C. L. Johnson, S. Lartigue-Korinek, G. Wang, P. R. Buseck, and M. J. Hÿtch

Calibration of projector lens distortions
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 181-190; doi:10.1093/jmicro/dfi042 [Abstract] [Full Text] [PDF] [Request Permissions]  

Kazuo Ishizuka and Brendan Allman

Phase measurement of atomic resolution image using transport of intensity equation
Journal of Electron Microscopy Advance Access published on August 2, 2005
J Electron Microsc (Tokyo) 2005 54: 191-197; doi:10.1093/jmicro/dfi024 [Abstract] [Full Text] [PDF] [Request Permissions]  

Lian-Mao Peng

Electron atomic scattering factors, Debye–Waller factors and the optical potential for high-energy electron diffraction
Journal of Electron Microscopy Advance Access published on August 2, 2005
J Electron Microsc (Tokyo) 2005 54: 199-207; doi:10.1093/jmicro/dfi045 [Abstract] [Full Text] [PDF] [Request Permissions]  

Jun Yamasaki, Tomoyuki Kawai, and Nobuo Tanaka

A simple method for minimizing non-linear image contrast in spherical aberration-corrected HRTEM
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 209-214; doi:10.1093/jmicro/dfi029 [Abstract] [Full Text] [PDF] [Request Permissions]  

Takayoshi Tanji, Hiromochi Tanaka, and Takayuki Kojima

Development of a real-time stereo transmission electron microscope
Journal of Electron Microscopy Advance Access published on June 30, 2005
J Electron Microsc (Tokyo) 2005 54: 215-222; doi:10.1093/jmicro/dfi025 [Abstract] [Full Text] [PDF] [Request Permissions]  

D. Nakaji, V. Grillo, N. Yamamoto, and T. Mukai

Contrast analysis of dislocation images in TEM–cathodoluminescence technique
J Electron Microsc (Tokyo) 2005 54: 223-230; doi:10.1093/jmicro/54.3.223 [Abstract] [Full Text] [PDF] [Request Permissions]  

Renu Sharma, Peter Rez, Michael M. J. Treacy, and Steven J. Stuart

In situ observation of the growth mechanisms of carbon nanotubes under diverse reaction conditions
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 231-237; doi:10.1093/jmicro/dfi037 [Abstract] [Full Text] [PDF] [Request Permissions]  

Martha R. McCartney

Characterization of charging in semiconductor device materials by electron holography
J Electron Microsc (Tokyo) 2005 54: 239-242; doi:10.1093/jmicro/54.3.239 [Abstract] [Full Text] [PDF] [Request Permissions]  

Zuzanna Liliental-Weber, Dmitri N. Zakharov, Kin M. Yu, Joel W. Ager, III, Wladyslaw Walukiewicz, Eugene E. Haller, Hai Lu, and William J. Schaff

Compositional modulation in In_xGa_1–xN: TEM and X-ray studies
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 243-250; doi:10.1093/jmicro/dfi033 [Abstract] [Full Text] [PDF] [Request Permissions]  

Jingyue Liu

Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 251-278; doi:10.1093/jmicro/dfi034 [Abstract] [Full Text] [PDF] [Request Permissions]  

Yoshitaka Aoyama, Young-Gil Park, and Daisuke Shindo

Analysis of magnetization in nanocomposite Nd_4.5(Fe,Cr)₇₇B_18.5 by electron holography and simulation
Journal of Electron Microscopy Advance Access published on September 26, 2005
J Electron Microsc (Tokyo) 2005 54: 279-286; doi:10.1093/jmicro/dfi027 [Abstract] [Full Text] [PDF] [Request Permissions]  

Yong Ding and Zhong Lin Wang

Electron energy-loss spectroscopy study of ZnO nanobelts
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 287-291; doi:10.1093/jmicro/dfi039 [Abstract] [Full Text] [PDF] [Request Permissions]  

Jing Zhu, Shang-Peng Gao, Ai-Hua Zhang, and Jun Yuan

Theoretical electron energy-loss spectroscopy and its application in materials research
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 293-298; doi:10.1093/jmicro/dfi041 [Abstract] [Full Text] [PDF] [Request Permissions]  

Fumio Watari

In situ quantitative analysis of etching process of human teeth by atomic force microscopy
Journal of Electron Microscopy Advance Access published on September 7, 2005
J Electron Microsc (Tokyo) 2005 54: 299-308; doi:10.1093/jmicro/dfi056 [Abstract] [Full Text] [PDF] [Request Permissions]  

Nan Yao, Kirk Hou, Christopher D. Haines, Nathan Etessami, Varadh Ranganathan, Susan B. Halpern, Bernard H. Kear, Lisa C. Klein, and George H. Sigel, Jr

Nanostructure of Er³⁺ doped silicates
Journal of Electron Microscopy Advance Access published on August 25, 2005
J Electron Microsc (Tokyo) 2005 54: 309-315; doi:10.1093/jmicro/dfi040 [Abstract] [Full Text] [PDF] [Request Permissions]  

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