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contents: volume 54 • 2005 • supplement 1   [Index by Author] 
 
International Symposium on the Creation of Novel Nanomaterials 2004
 

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Hisazumi Akai, Akira Harada, Tadashi Itoh, Hiroshi Kanazawa, Seiji Takeda, and Hitoshi Watarai

J Electron Microsc (Tokyo) 2005 54: i1; doi:10.1093/jmicro/54.suppl_1.i1 [PDF]  

Yoshikazu Homma, Daisuke Takagi, Satoru Suzuki, Ken-ich Kanzaki, and Yoshihiro Kobayashi

J Electron Microsc (Tokyo) 2005 54: i3-i7; doi:10.1093/jmicro/54.suppl_1.i3 [Abstract] [PDF]  

Atsushi Nishiwaki and Takeo Oku

J Electron Microsc (Tokyo) 2005 54: i9-i14; doi:10.1093/jmicro/54.suppl_1.i9 [Abstract] [PDF]  

Hideo Kohno, Isamu Kikuo, and Kenichi Oto

J Electron Microsc (Tokyo) 2005 54: i15-i19; doi:10.1093/jmicro/54.suppl_1.i15 [Abstract] [PDF]  

Axel Woelke, Soichi Imanaka, Shinichi Watanabe, Seishiro Goto, Michihiro Hashinokuchi, Michio Okada, and Toshio Kasai

J Electron Microsc (Tokyo) 2005 54: i21-i24; doi:10.1093/jmicro/54.suppl_1.i21 [Abstract] [PDF]  

Nobuhiko Ozaki, Yutaka Ohno, Jun Kikkawa, and Seiji Takeda

J Electron Microsc (Tokyo) 2005 54: i25-i29; doi:10.1093/jmicro/54.suppl_1.i25 [Abstract] [PDF]  

DaeGwi Kim, Masashi Miyamoto, and Masaaki Nakayama

J Electron Microsc (Tokyo) 2005 54: i31-i34; doi:10.1093/jmicro/54.suppl_1.i31 [Abstract] [PDF]  

Soichi Takeda

J Electron Microsc (Tokyo) 2005 54: i35-i41; doi:10.1093/jmicro/54.suppl_1.i35 [Abstract] [PDF]  

M. Joanne Lemieux, Yafei Huang, and Da Neng Wang

J Electron Microsc (Tokyo) 2005 54: i43-i46; doi:10.1093/jmicro/54.suppl_1.i43 [Abstract] [PDF]  

Toshiaki Arata, Motoyoshi Nakamura, Shoji Ueki, Kazunori Sugata, Tomoki Aihara, Keisuke Ueda, Satoshi Yasuda, Ryouhei Narumi, Hiroko Kusuhara, and Yukio Yamamoto

J Electron Microsc (Tokyo) 2005 54: i47-i51; doi:10.1093/jmicro/54.suppl_1.i47 [Abstract] [PDF]  

P. H. Dederichs, I. Galanakis, and Ph. Mavropoulos

J Electron Microsc (Tokyo) 2005 54: i53-i56; doi:10.1093/jmicro/54.suppl_1.i53 [Abstract] [PDF]  

Rui Sakano and Norio Kawakami

J Electron Microsc (Tokyo) 2005 54: i57-i60; doi:10.1093/jmicro/54.suppl_1.i57 [Abstract] [PDF]  

Van An Dinh and Hiroshi Katayama-Yoshida

J Electron Microsc (Tokyo) 2005 54: i61-i64; doi:10.1093/jmicro/54.suppl_1.i61 [Abstract] [PDF]  

S. Mori, T. Asaka, Y. Horibe, Y. Matsui, and K. Takenaka

J Electron Microsc (Tokyo) 2005 54: i65-i68; doi:10.1093/jmicro/54.suppl_1.i65 [Abstract] [PDF]  

Gen Tatara and Hiroshi Kohno

J Electron Microsc (Tokyo) 2005 54: i69-i74; doi:10.1093/jmicro/54.suppl_1.i69 [Abstract] [PDF]  

C. Uyeda, M. Skakibara, K. Tanaka, and R. Takashima

J Electron Microsc (Tokyo) 2005 54: i75-i79; doi:10.1093/jmicro/54.suppl_1.i75 [Abstract] [PDF]  

Tomoki Akita, Mitsutaka Okumura, Koji Tanaka, Masanori Kohyama, Susumu Tsubota, and Masatake Haruta

J Electron Microsc (Tokyo) 2005 54: i81-i85; doi:10.1093/jmicro/54.suppl_1.i81 [Abstract] [PDF]  

Y. Horibe, K. Kishimoto, S. Mori, and N. Ikeda

J Electron Microsc (Tokyo) 2005 54: i87-i90; doi:10.1093/jmicro/54.suppl_1.i87 [Abstract] [PDF]  

To see an article, click its [Full Text] or [PDF] link. To review many abstracts, check the boxes to the left of the titles you want, and click the 'Get All Checked Abstract(s)' button. To see one abstract at a time, click its [Abstract] link.