Journal of Electron Microscopy

Physical: Full-length:

F. Lin, F. R. Chen, Q. Chen, D. Tang, and L.-M. Peng

The wrap-around problem and optimal padding in the exit wave reconstruction using HRTEM images
Journal of Electron Microscopy Advance Access published on October 18, 2006
J Electron Microsc (Tokyo) 2006 55: 191-200; doi:10.1093/jmicro/dfl025 [Abstract] [Full Text] [PDF] [Request Permissions]  

Masanori Mitome

Visibility of Si nanoparticles embedded in an amorphous SiO₂ matrix
Journal of Electron Microscopy Advance Access published on November 1, 2006
J Electron Microsc (Tokyo) 2006 55: 201-207; doi:10.1093/jmicro/dfl026 [Abstract] [Full Text] [PDF] [Request Permissions]  

Bo Yao, Rumyana V. Petrova, Richard R. Vanfleet, and Kevin R. Coffey

A modified back-etch method for preparation of plan-view high-resolution transmission electron microscopy samples
Journal of Electron Microscopy Advance Access published on October 13, 2006
J Electron Microsc (Tokyo) 2006 55: 209-214; doi:10.1093/jmicro/dfl027 [Abstract] [Full Text] [PDF] [Request Permissions]  

Shunsuke Muto, Richard C. Puetter, and Kazuyoshi Tatsumi

Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: I. Principle and test examples
Journal of Electron Microscopy Advance Access published on December 5, 2006
J Electron Microsc (Tokyo) 2006 55: 215-223; doi:10.1093/jmicro/dfl028 [Abstract] [Full Text] [PDF] [Request Permissions]  

Shunsuke Muto, Kazuyoshi Tatsumi, Richard C. Puetter, Tomoko Yoshida, Yu Yamamoto, and Yusuke Sasano

Spectral restoration and energy resolution improvement of electron energy-loss spectra by Pixon reconstruction: II. Application to practical ELNES analysis of low SNR
Journal of Electron Microscopy Advance Access published on December 20, 2006
J Electron Microsc (Tokyo) 2006 55: 225-230; doi:10.1093/jmicro/dfl029 [Abstract] [Full Text] [PDF] [Request Permissions]  

Biological: Full-length:

Hisatake Kondo

Embedment-free section electron microscopy
Journal of Electron Microscopy Advance Access published on December 21, 2006
J Electron Microsc (Tokyo) 2006 55: 231-243; doi:10.1093/jmicro/dfl030 [Abstract] [Full Text] [PDF] [Request Permissions]  

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