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Cover Figure


Cover Caption

The Fourier transform of a 64 mrad diameter patch from a simulated electron Ronchigram of 4 nm thick strontium titanate [100]. Defocus = −600 nm, spherical aberration = 0.1 mm at 300 kV. For a large patch, the positions of the heads of the comet-like spots depend on the sample and primarily the low-order aberrations (such as defocus), while the tails depend on higher-order aberrations.

Lupini A R and Pennycook S J (2008) Rapid autotuning for crystalline specimens from an inline hologram. Journal of Electron Mircoscopy 57: 197.



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