Cover Caption
High angle annual dark field STEM intensities of SrTiO3 at thickness = 54 nm with convergent angle α = 27 mrad and collection angle β = 64–341 mrad. (a) Experiment; (b) Simulation; (c) Intensity profiles of experiment (circles) and simulation (solid line); (d-e) Intensities of experiment (d) and simulation (e) viewed in 3D. (f) 3D plot of intensity ratio of Sr column to TiO column (ISr/ITiO) vs. thickness (0.39 nm to 62.4 nm) and collection inner angle (2 mrad to 200 mrad).
Inada H, Wu L, Wall J, Su D and Zhu Y (2009) Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM. Journal of Electron Mircoscopy 58: 111.
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