Journal of Electron Microscopy

Special number: Preface

Yimei Zhu and Konrad Jarausch

Advanced electron microscopy in materials physics
Journal of Electron Microscopy Advance Access published on April 30, 2009
J Electron Microsc (Tokyo) 2009 58: 73-75; doi:10.1093/jmicro/dfp014 [FREE Full Text] [PDF] [Request Permissions]  

Special number: History/Review

Get checked abstract Harald H. Rose

Historical aspects of aberration correction
Journal of Electron Microscopy Advance Access published on March 1, 2009
J Electron Microsc (Tokyo) 2009 58: 77-85; doi:10.1093/jmicro/dfp012 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Stephen J. Pennycook, Maria Varela, Andrew R. Lupini, Mark P. Oxley, and Matthew F. Chisholm

Atomic-resolution spectroscopic imaging: past, present and future
Journal of Electron Microscopy Advance Access published on January 21, 2009
J Electron Microsc (Tokyo) 2009 58: 87-97; doi:10.1093/jmicro/dfn030 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Alan Maigné and Ray D. Twesten

Review of recent advances in spectrum imaging and its extension to reciprocal space
Journal of Electron Microscopy Advance Access published on April 27, 2009
J Electron Microsc (Tokyo) 2009 58: 99-109; doi:10.1093/jmicro/dfp022 [Abstract] [Full Text] [PDF] [Request Permissions]  

Special number: Instrumentation/Performance

Get checked abstract Hiromi Inada, Lijun Wu, Joe Wall, Dong Su, and Yimei Zhu

Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM
Journal of Electron Microscopy Advance Access published on March 1, 2009
J Electron Microsc (Tokyo) 2009 58: 111-122; doi:10.1093/jmicro/dfp011 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Philip E. Batson

Control of parasitic aberrations in multipole optics
Journal of Electron Microscopy Advance Access published on March 5, 2009
J Electron Microsc (Tokyo) 2009 58: 123-130; doi:10.1093/jmicro/dfp015 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Mitsuhiro Saito, Koji Kimoto, Takuro Nagai, Shun Fukushima, Daisuke Akahoshi, Hideki Kuwahara, Yoshio Matsui, and Kazuo Ishizuka

Local crystal structure analysis with 10-pm accuracy using scanning transmission electron microscopy
Journal of Electron Microscopy Advance Access published on November 25, 2008
J Electron Microsc (Tokyo) 2009 58: 131-136; doi:10.1093/jmicro/dfn023 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Jessie Shiue, Chia-Seng Chang, Sen-Hui Huang, Chih-Hao Hsu, Jin-Sheng Tsai, Wei-Hau Chang, Yi-Min Wu, Yen-Chen Lin, Pai-Chia Kuo, Yang-Shan Huang, Yeukuang Hwu, Ji-Jung Kai, Fan-Gang Tseng, and Fu-Rong Chen

Phase TEM for biological imaging utilizing a Boersch electrostatic phase plate: theory and practice
Journal of Electron Microscopy Advance Access published on March 16, 2009
J Electron Microsc (Tokyo) 2009 58: 137-145; doi:10.1093/jmicro/dfp006 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Bernd Kabius, Peter Hartel, Maximilian Haider, Heiko Müller, Stephan Uhlemann, Ulrich Loebau, Joachim Zach, and Harald Rose

First application of C_c-corrected imaging for high-resolution and energy-filtered TEM
Journal of Electron Microscopy Advance Access published on April 27, 2009
J Electron Microsc (Tokyo) 2009 58: 147-155; doi:10.1093/jmicro/dfp021 [Abstract] [Full Text] [PDF] [Request Permissions]  

Special number: Methods

Get checked abstract Huolin L. Xin and David A. Muller

Aberration-corrected ADF-STEM depth sectioning and prospects for reliable 3D imaging in S/TEM
Journal of Electron Microscopy Advance Access published on January 22, 2009
J Electron Microsc (Tokyo) 2009 58: 157-165; doi:10.1093/jmicro/dfn029 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Lionel C. Gontard, Rafal E. Dunin-Borkowski, Mhairi H. Gass, Andrew L. Bleloch, and Dogan Ozkaya

Three-dimensional shapes and structures of lamellar-twinned fcc nanoparticles using ADF STEM
Journal of Electron Microscopy Advance Access published on February 11, 2009
J Electron Microsc (Tokyo) 2009 58: 167-174; doi:10.1093/jmicro/dfp003 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Konrad Jarausch and Donovan N. Leonard

Three-dimensional electron microscopy of individual nanoparticles
Journal of Electron Microscopy Advance Access published on December 24, 2008
J Electron Microsc (Tokyo) 2009 58: 175-183; doi:10.1093/jmicro/dfn028 [Abstract] [Full Text] [PDF] [Supplementary Data] [Request Permissions]  

Special number: Applications

Get checked abstract R. F. Klie, W. Walkosz, G. Yang, and Y. Zhao

Aberration-corrected Z-contrast imaging of SrTiO₃ dislocation cores
Journal of Electron Microscopy Advance Access published on December 12, 2008
J Electron Microsc (Tokyo) 2009 58: 185-191; doi:10.1093/jmicro/dfn026 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Douglas A. Blom, William D. Pyrz, Tom Vogt, and Douglas J. Buttrey

Aberration-corrected STEM investigation of the M2 phase of MoVNbTeO selective oxidation catalyst
Journal of Electron Microscopy Advance Access published on December 4, 2008
J Electron Microsc (Tokyo) 2009 58: 193-198; doi:10.1093/jmicro/dfn025 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Lawrence F. Allard, Albina Borisevich, Weiling Deng, Rui Si, Maria Flytzani-Stephanopoulos, and Steven H. Overbury

Evolution of gold structure during thermal treatment of Au/FeO_x catalysts revealed by aberration-corrected electron microscopy
Journal of Electron Microscopy Advance Access published on April 1, 2009
J Electron Microsc (Tokyo) 2009 58: 199-212; doi:10.1093/jmicro/dfp016 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract Rodney A. Herring

Electron beam coherence measurements using diffracted beam interferometry/holography
Journal of Electron Microscopy Advance Access published on January 13, 2009
J Electron Microsc (Tokyo) 2009 58: 213-221; doi:10.1093/jmicro/dfn027 [Abstract] [Full Text] [PDF] [Request Permissions]  

Get checked abstract David G. Morgan, Quentin M. Ramasse, and Nigel D. Browning

Application of two-dimensional crystallography and image processing to atomic resolution Z-contrast images
Journal of Electron Microscopy Advance Access published on March 17, 2009
J Electron Microsc (Tokyo) 2009 58: 223-244; doi:10.1093/jmicro/dfp007 [Abstract] [Full Text] [PDF] [Request Permissions]  

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