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Previous 		Contents: Volume 57, Number 3, June 2008   [Index by Author] 

Down Physical: Full-length
Down Physical: Note
Down Biological: Full-length


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Front Matter (PDF) | Back Matter (PDF) | Table of Contents (PDF)

To see an article, click its [Full Text] or [PDF] link. To review many abstracts, check the boxes to the left of the titles you want, and click the 'Get All Checked Abstract(s)' button. To see one abstract at a time, click its [Abstract] link.

Physical: Full-length Back

Johannes Biskupek, Ute Kaiser, and Fritz Falk
Heat- and electron-beam-induced transport of gold particles into silicon oxide and silicon studied by in situ high-resolution transmission electron microscopy
J Electron Microsc (Tokyo) 2008 57: 83-89; doi:10.1093/jmicro/dfn008 [Abstract] [Full Text] [PDF] [Request Permissions]  

Physical: Note Back

Z. Yao, S. Xu, M. L. Jenkins, and M. A. Kirk
Preparation of TEM samples of ferritic alloys
Journal of Electron Microscopy Advance Access published on March 3, 2008
J Electron Microsc (Tokyo) 2008 57: 91-94; doi:10.1093/jmicro/dfn004 [Abstract] [Full Text] [PDF] [Request Permissions]  

Biological: Full-length Back

Flávio Costa Miguens
Surface replicas of normal and vitrified leaves of Datura insignis, Barb Rodr
Journal of Electron Microscopy Advance Access published on April 1, 2008
J Electron Microsc (Tokyo) 2008 57: 95-100; doi:10.1093/jmicro/dfn005 [Abstract] [Full Text] [PDF] [Request Permissions]  

Takuo Yasunaga and Takeyuki Wakabayashi
Evaluation of a 2k CCD camera with an epitaxially grown CsI scintillator for recording energy-filtered electron cryo-micrographs
Journal of Electron Microscopy Advance Access published on May 8, 2008
J Electron Microsc (Tokyo) 2008 57: 101-112; doi:10.1093/jmicro/dfn006 [Abstract] [Full Text] [PDF] [Request Permissions]  

Kanjaksha Ghosh, Shobha Gangodkar, Preksha Jain, Shrimati Shetty, Sandhya Ramjee, Pankaj Poddar, and Atanu Basu
Imaging the interaction between dengue 2 virus and human blood platelets using atomic force and electron microscopy
Journal of Electron Microscopy Advance Access published on May 8, 2008
J Electron Microsc (Tokyo) 2008 57: 113-118; doi:10.1093/jmicro/dfn007 [Abstract] [Full Text] [PDF] [Request Permissions]  

To see an article, click its [Full Text] or [PDF] link. To review many abstracts, check the boxes to the left of the titles you want, and click the 'Get All Checked Abstract(s)' button. To see one abstract at a time, click its [Abstract] link.